HF2000-FEG H9000NAR

Electron microscopes: HF2000-FEG, 200 kV : analytical microscope H9000NAR, 300 kV : high resolution microscope   Person in charge: : Philippe MOREAU MicroCharacterization Center

Transmission Electron Microscopy (TEM) is a major characterization technique in materials science. In particular, it allows to :

• study extremely small materials quantities  << 1 mg

• gather a large variety of information : morphology, atomic and electronic structures, chemical compositions, …

• collect very local information: on a few nanometer scale

Please visit our research groups pages for more application examples

HF2000-FEG, 200 kV - analytical microscope
Main features : Small probe size (2 nm). Atomic resolution  (2.3 Å) Various sample holders: Liquid Nitrogen cooling;  vacuum transfer; double tilt; ..…)
EELS spectrum for Li1,8Ti2,7Cr0,5O7, negative material for lithium batteries .	Electron Energy Loss Spectroscopy (EELS)     * Spectrometer : GATAN666 modified (CCD)       Energy resolution: 0.8 eV     * Detection, quantification oxidation states of all elements (lithium to uranium)
EDX spectrum of a oxidized Cu3P nanoparticle.	EDX detector (Energy Dispersive X-Ray)   Some examples of materials we are interested in: Lithium battery materials, titanium dioxide, conducting polymers, CNx, various semiconductors…

H9000NAR, 300 kV - high resolution images
Features : high resolution: 1.8 Å, nanodiffraction, EDX detector.
High resolution electron microscopy image of a Bi3,5La0,75La0,75Ti3O12 crystal (material for ferroelectric memories, FRAM) along the [001] zone axis. Intergrowth defects are visualized on the crystal edges.
High resolution electron microscopy image of a Sr9/8TiS3 crystal showing superdislocations along the [001] direction
High resolution electron microscopy image of nanoparticules mostly made of titanium dioxide included in a sol. Application : photobatteries.

Download the brochure of the MicroCharacterization Center: ( .pdf format, 935Ko)