Optoelectronic Analysis of Submicrometer-Scale Materials: How Can Optical or Transport Properties Be Measured at the Nanostructure Scale?
Thomas BIDAUD
Institut des Matériaux de Nantes Jean Rouxel
The purpose of this seminar is to present the operating principle as well as various characterization techniques and methods for determining optical and/or transport properties in submicrometer-scale structures. These tools rely on the use of an electronic probe that enables localized excitation. The study of “cathodoluminescence ” (CL), “electron beam induced current” (EBIC), and “electron back-scattered diffraction” (EBSD) resulting from this excitation helps improve our understanding of the mechanisms at work within nanostructures.
Optical physical quantities (gap, polarization) or transport properties (τ, Ldiff) can thus be determined from this type of measurement. Superimposing these different maps provides a particularly powerful tool for locating and determining the physicochemical origin of loss mechanisms within materials.
By combining these nanoscale measurements with characterizations performed at the device scale (PL/RAMAN/XRD), a multiscale analysis can be conducted to better understand the phenomena that limit the performance of these devices. Thus, a research project based on these various methods will be presented during this seminar.
Next, Attolight AG, a company that develops measurement tools based on electron microscopy, will present various characterization solutions, including the Allalin platform and several add-ons for electron microscopes.
Originally designed to perform quantitative cathodoluminescence (qCL) and time-resolved cathodoluminescence (TRCL) measurements, the Allalin platform has gradually evolved through the integration of additional features. These include, in particular, photoluminescence (PL), time-resolved photoluminescence (TRPL), Raman spectroscopy, as well as the adaptation of nanoprobes for performing local electrical measurements (EBIC/EBAC) and electroluminescence (EL).
Now in use at more than 20 public and private research centers around the world, the Allalin platform enables unprecedented analyses in numerous fields, including semiconductors, optics and photonics, lasers, thin films, and nano-objects.
